• DocumentCode
    2377696
  • Title

    The process and challenges of a high-speed DUT board project

  • Author

    McFeely, David E.

  • Author_Institution
    Autom. Test Group, Agilent Technol., Santa Clara, CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    565
  • Lastpage
    573
  • Abstract
    This paper addresses the overall project needs and recommended project practices for a high-speed ATE interface. The interface between the device under test (DUT) and the test system is typically referred to as a DUT board or loadboard. The goal of developing a high-speed loadboard is to maintain high signal integrity on those signal lines where it is critical to the performance of the device, and accurate testing. This paper will focus more on project management, and fabrication issues in implementing a high-speed design and less on high-speed design techniques. High-speed design techniques will be touched upon as needed to illustrate the key message. The goal of this paper is to complement other design technique based papers and provide a complete picture of a loadboard activity.
  • Keywords
    automatic test equipment; printed circuit testing; production testing; project management; device under test; high-speed ATE interface; high-speed DUT board project; high-speed design; loadboard activity; overall project needs; project management; signal integrity; Atherosclerosis; Automatic testing; Costs; Delay; Fabrication; Production; Project management; Switches; System testing; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2002. Proceedings. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7542-4
  • Type

    conf

  • DOI
    10.1109/TEST.2002.1041807
  • Filename
    1041807