FRITS - a microprocessor functional BIST method

This paper describes a novel functional Built-in-Self-Test (BIST) method for microprocessors. This technique is based on the fundamental principle that complex chips have embedded functionality that can be used to implement a comprehensive self-test strategy. Functional testing has generally been associated with expensive testers. In order to lower the cost of test, there is a general trend to adopt structural test techniques like scan that enable the use of low cost testers. One of the key advantages of the test method described here is that it enables functional testing of microprocessors on low cost testers. Detailed implementation of this technique, the test generation methodology, the fault grade methodology and silicon results on Intel^® Pentium^® 4 and Itanium™ family microprocessors are presented.