DocumentCode
2377872
Title
The manic depression of microprocessor debug
Author
Josephson, Don Douglas
Author_Institution
Hewlett-Packard Co., Fort Collins, CO, USA
fYear
2002
fDate
2002
Firstpage
657
Lastpage
663
Abstract
This paper describes the sometimes exhilarating, sometimes depressing, and always challenging job of leading-edge microprocessor debug. It covers an overview of processor debug, the flows, tools and methods used to perform debug, the process of "root causing" and fixing bugs, and includes case studies of actual bugs from recent processors. In conclusion, some of the future challenges for microprocessor testing are presented.
Keywords
computer debugging; computer testing; failure analysis; integrated circuit testing; microprocessor chips; failure modes; microprocessor debugging; microprocessor testing; shmoo; Circuit testing; Computer bugs; Frequency; Job design; Low voltage; Manuals; Microprocessors; Needles; Silicon; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041817
Filename
1041817
Link To Document