DocumentCode
2377958
Title
A fluxless oxidation-free bonding technology
Author
Lee, Chin C. ; Chen, Yi-Chia ; Matijasevic, Goran ; Metzler, Richard
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
fYear
1994
fDate
1-4 May 1994
Firstpage
595
Lastpage
599
Abstract
A fluxless oxidation-free bonding technology is reported. The technology uses the direct deposition of multilayer composite in high vacuum to prevent oxidation. The outer layer of the composite is either gold or copper which protects the inner layers from oxidation when the composite is later exposed to atmosphere. As a result of oxidation prevention neither flux nor scrubbing action is required in the bonding process. Two processes based on Pb-Sn-Au and Sn-Cu have been developed for a processing temperature of 250°C to prove the working concept. GaAs dies have been well bonded on glass and alumina substrates as shown by scanning acoustic microscope. SEM and EDX studies verify the bonding principle, reveal the bonding mechanism and identify the intermetallic compounds in the joints. Apart from fluxless feature, other advantages include good control of joint thickness, good control of composition, and direct deposition of bonding media on wafers or substrates
Keywords
X-ray chemical analysis; acoustic microscopy; integrated circuit packaging; microassembling; scanning electron microscopy; soldering; 250 degC; EDX studies; GaAs dies; Pb-Sn-Au solder; PbSnAu; SEM; Sn-Cu solder; SnCu; bonding mechanism; bonding technology; direct deposition; fluxless oxidation-free bonding; intermetallic compounds; joint thickness; multilayer composite; processing temperature; scanning acoustic microscope; Atmosphere; Copper; Gold; Nonhomogeneous media; Oxidation; Protection; Scanning electron microscopy; Thickness control; Vacuum technology; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1994. Proceedings., 44th
Conference_Location
Washington, DC
Print_ISBN
0-7803-0914-6
Type
conf
DOI
10.1109/ECTC.1994.367615
Filename
367615
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