Title :
A new method for testing jitter tolerance of SerDes devices using sinusoidal jitter
Author :
Yamaguchi, Takahiro J. ; Soma, Mani ; Ishida, Masahiro ; Musha, Hirobumi ; Malarsie, Louis
Author_Institution :
Advantest Labs. Ltd., Miyagi, Japan
Abstract :
This paper presents a new method for measuring jitter tolerance of a SerDes receiver using the timing misalignment between the jittered source clock and the recovered clock. A sinusoidal jitter is injected into the serial bit stream. The method derives an equation for estimating BER accurately and is 10× faster than the conventional BER test method The accuracy and test speed of the method are verified by 2.5 Gbps and 10 Gbps-SerDes experiments.
Keywords :
automatic test equipment; clocks; digital systems; error statistics; synchronisation; telecommunication equipment testing; timing jitter; 10 Gbit/s; 2.5 Gbit/s; BER; SerDes devices; communication devices; jitter tolerance; jittered source clock; recovered clock; serial bit stream; serializer/deserializer devices; sinusoidal jitter; test speed; timing misalignment; Bit error rate; Circuit testing; Clocks; Costs; Degradation; Equations; Terminology; Timing jitter; Transfer functions; Uncertainty;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041824
