Title :
Evaluation of integrated circuit´s design limits
Author :
Andonova, Anna V. ; Savov, Dimitar T.
Author_Institution :
Dept. of Microelectron., Tech. Univ. of Sofia, Bulgaria
Abstract :
This paper presents an approach to evaluate the design limits of integrated circuits. The basis of that approach is a destructive evaluation performed on a small number of test items to measure their design limits. Results from applying it demonstrate that the approach can be quite effective for ALT experiments
Keywords :
integrated circuit design; integrated circuit testing; life testing; accelerated life test; design limit; integrated circuit; Application specific integrated circuits; Circuit synthesis; Circuit testing; Integrated circuit testing; Life estimation; Life testing; Manufacturing; Performance evaluation; Predictive models; Stress;
Conference_Titel :
Semiconductor Conference, 1998. CAS '98 Proceedings. 1998 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-4432-4
DOI :
10.1109/SMICND.1998.732368
