• DocumentCode
    2378070
  • Title

    Laser created high density interconnects for quick prototyping of electronic circuits

  • Author

    Lee, Rex A. ; Moreno, Wilfrido A. ; Saini, Nitin ; Whittaker, Dennis

  • Author_Institution
    Center for Microelectron. Res., Univ. of South Florida, Tampa, FL, USA
  • fYear
    1994
  • fDate
    1-4 May 1994
  • Firstpage
    270
  • Lastpage
    272
  • Abstract
    The laser restructuring of electronic circuits, fabricated using standard Very Large Scale Integration (VLSI) process techniques, is an excellent alternative to custom chip development. This laser process allows for low cost, quick turnaround production with full circuit similarity between the Laser Restructured prototype and the customized product for mass production. The same techniques are also compatible with thin multichip modules (MCM-D). Laser Restructurable VLSI (LRVLSI) would allow design engineers the capability to interconnect cells that implement generic logic functions and signal processing schemes to achieve a higher level of design complexity. LRVLSI of a particular circuit at the wafer or packaged chip level is accomplished using an integrated computer controlled laser system to create low electrical resistance links between conductors and to cut conductor lines. An infrastructure for rapid prototyping and quick turnaround using Laser Restructuring of VLSI circuits was developed
  • Keywords
    VLSI; integrated circuit interconnections; integrated circuit metallisation; integrated circuit packaging; laser materials processing; multichip modules; MCM-D; VLSI; circuit similarity; conductor lines; design complexity; electrical resistance links; generic logic functions; high density interconnects; laser restructuring; prototyping; quick turnaround production; signal processing schemes; thin multichip modules; Conductors; Electronic circuits; Integrated circuit interconnections; Laser beam cutting; Mass production; Optical design; Prototypes; Signal design; Standards development; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1994. Proceedings., 44th
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-0914-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1994.367621
  • Filename
    367621