• DocumentCode
    2378222
  • Title

    Evaluating plastic assembly processes for high reliability applications using HAST and assembly test chips

  • Author

    Emerson, John A. ; Sweet, James N. ; Peterson, David W.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    1994
  • fDate
    1-4 May 1994
  • Firstpage
    191
  • Lastpage
    195
  • Abstract
    We demonstrate the use of HAST and Assembly Test Chips (ATCs) to evaluate the susceptibility of epoxy molding compounds to moisture induced corrosion of Al conductors. We show that the procedure is sufficiently sensitive to discriminate between assembly processes used by different molding facilities. Our data show that the location in time of the “knee” in the failure distribution is dependent on material properties of the epoxy. Reducing the failure rate in the early or “extrinsic” region of the time-failure distribution is key to achieving high reliability. We examine the failure modes in the extrinsic region for test chips encapsulated with a number of high quality molding compounds in an attempt to better understand this region
  • Keywords
    corrosion; encapsulation; failure analysis; integrated circuit metallisation; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; life testing; microassembling; moisture; plastic packaging; Al; Al conductors; HAST; assembly test chips; epoxy molding compounds; extrinsic region; failure distribution; failure modes; failure rate; high reliability applications; highly accelerated stress test; material properties; moisture induced corrosion; plastic assembly processes; plastic encapsulated IC; Artificial intelligence; Assembly; Corrosion; Distribution functions; Knee; Laboratories; Moisture; Packaging; Plastics; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1994. Proceedings., 44th
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-0914-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1994.367631
  • Filename
    367631