DocumentCode
2378222
Title
Evaluating plastic assembly processes for high reliability applications using HAST and assembly test chips
Author
Emerson, John A. ; Sweet, James N. ; Peterson, David W.
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
fYear
1994
fDate
1-4 May 1994
Firstpage
191
Lastpage
195
Abstract
We demonstrate the use of HAST and Assembly Test Chips (ATCs) to evaluate the susceptibility of epoxy molding compounds to moisture induced corrosion of Al conductors. We show that the procedure is sufficiently sensitive to discriminate between assembly processes used by different molding facilities. Our data show that the location in time of the “knee” in the failure distribution is dependent on material properties of the epoxy. Reducing the failure rate in the early or “extrinsic” region of the time-failure distribution is key to achieving high reliability. We examine the failure modes in the extrinsic region for test chips encapsulated with a number of high quality molding compounds in an attempt to better understand this region
Keywords
corrosion; encapsulation; failure analysis; integrated circuit metallisation; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; life testing; microassembling; moisture; plastic packaging; Al; Al conductors; HAST; assembly test chips; epoxy molding compounds; extrinsic region; failure distribution; failure modes; failure rate; high reliability applications; highly accelerated stress test; material properties; moisture induced corrosion; plastic assembly processes; plastic encapsulated IC; Artificial intelligence; Assembly; Corrosion; Distribution functions; Knee; Laboratories; Moisture; Packaging; Plastics; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1994. Proceedings., 44th
Conference_Location
Washington, DC
Print_ISBN
0-7803-0914-6
Type
conf
DOI
10.1109/ECTC.1994.367631
Filename
367631
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