Implementation of model-based testing for medium- to high-resolution Nyquist-rate ADCs

Author

Wegener, Carsten ; Kennedy, Michael Peter

Author_Institution

Dept. of Microelectron. Eng., Univ. Coll. Cork, Ireland

fYear

2002

fDate

2002

Firstpage

851

Lastpage

860

Abstract

The Linear Error Mechanism Modeling Algorithm (LEMMA has been developed with the aim of reducing test costs for DACs and ADCs, a particularly important class of mixed-signal integrated circuits. In this contribution, for the example of a 12-bit ADC, we report on the development and verification of LEMMA in an industrial production test environment. From the insight gained, we estimate the requirements and return-of-investment for higher resolution devices where traditional test techniques exhaust the time budget allowed for testing commodity parts.

Keywords

analogue-digital conversion; automatic testing; design for testability; integrated circuit testing; production testing; 12 bit; DFT; INL distribution; LEMMA; Nyquist-rate ADCs; high-resolution ADCs; industrial production test environment; linear error mechanism modeling algorithm; medium-resolution ADCs; mixed-signal integrated circuits; model-based testing; return-of-investment; test point selection; Automatic testing; Circuit testing; Microelectronics; Noise measurement; Noise reduction; Performance evaluation; Semiconductor device manufacture; Semiconductor device noise; Signal generators; Signal processing algorithms;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2002. Proceedings. International

ISSN

1089-3539

Print_ISBN

0-7803-7542-4

Type

conf

DOI

10.1109/TEST.2002.1041839

Filename

1041839