DocumentCode :
2378291
Title :
Test setup simulation - a high-performance VHDL-based virtual test solution meeting industrial requirements
Author :
Krampl, Gunter ; Rona, Marco ; Tauber, Hermann
Author_Institution :
Infineon Technol. Microelectron. Design Centers Austria GmbH, Villach, Austria
fYear :
2002
fDate :
2002
Firstpage :
870
Lastpage :
878
Abstract :
Virtual test (VT) allows the debug of mixed-signal test programs and associated test hardware in a simulation environment if (1) a cheap, fast and sufficiently accurate chip model, and (2) a converter software linking test programs to simulators can be made available. This paper presents TSS (test setup simulation), a high-performance VT solution based on pure VHDL modeling of the hardware involved, a VHDL-based virtual tester concept and a snapshot test data extractor linking the test program to a simulator together with VT results for a complex telecom device.
Keywords :
automatic test equipment; circuit simulation; hardware description languages; hybrid simulation; integrated circuit modelling; integrated circuit testing; mixed analogue-digital integrated circuits; program debugging; virtual instrumentation; ATE; TSS; VT; accurate chip models; high-performance VHDL-based virtual test; mixed-signal test program debug; mixed-signal test setup simulation; pure VHDL hardware modeling; snapshot test data extractor; test hardware debug; test program/simulator linking converter software; virtual tester; Circuit simulation; Circuit testing; Costs; Crosstalk; Debugging; Design engineering; Hardware; Joining processes; Manufacturing; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2002. Proceedings. International
ISSN :
1089-3539
Print_ISBN :
0-7803-7542-4
Type :
conf
DOI :
10.1109/TEST.2002.1041841
Filename :
1041841
Link To Document :
بازگشت