Title :
Instantaneous availability and interval availability for systems with time-varying failure rate: stair-step approximation
Author :
Sun, Hairong ; Han, James J.
Author_Institution :
High Availability & Reliability Technol. Center, Motorola, Elk Grove Village, IL, USA
Abstract :
Because of the fast pace of information technology, an electronic product may be in the field for just a couple of years. Therefore, instantaneous availability and interval availability during its operational lifetime are more important metrics than the steady-state availability. The paper presents a stair-step approximation to the instantaneous availability and interval availability for systems with time-varying failure rates. The precision of the stair-step approximation is discussed. Numerical results for the systems with Weibull failure rate reveal that the steady-state availability may give an optimistic (pessimistic) evaluation to the systems with decreasing (increasing) failure rate
Keywords :
Weibull distribution; fault tolerant computing; reliability; time-varying systems; Weibull failure rate; decreasing failure rate; electronic product; information technology; instantaneous availability; interval availability; operational lifetime; optimistic evaluation; stair-step approximation; steady-state availability; time-varying failure rate; Availability; Couplings; Exponential distribution; Failure analysis; Information technology; Probability density function; Shape; Steady-state; Sun; Time varying systems;
Conference_Titel :
Dependable Computing, 2001. Proceedings. 2001 Pacific Rim International Symposium on
Conference_Location :
Seoul
Print_ISBN :
0-7695-1414-6
DOI :
10.1109/PRDC.2001.992722
