Instantaneous availability and interval availability for systems with time-varying failure rate: stair-step approximation

Author

Sun, Hairong ; Han, James J.

Author_Institution

High Availability & Reliability Technol. Center, Motorola, Elk Grove Village, IL, USA

fYear

2001

fDate

2001

Firstpage

371

Lastpage

374

Abstract

Because of the fast pace of information technology, an electronic product may be in the field for just a couple of years. Therefore, instantaneous availability and interval availability during its operational lifetime are more important metrics than the steady-state availability. The paper presents a stair-step approximation to the instantaneous availability and interval availability for systems with time-varying failure rates. The precision of the stair-step approximation is discussed. Numerical results for the systems with Weibull failure rate reveal that the steady-state availability may give an optimistic (pessimistic) evaluation to the systems with decreasing (increasing) failure rate

Keywords

Weibull distribution; fault tolerant computing; reliability; time-varying systems; Weibull failure rate; decreasing failure rate; electronic product; information technology; instantaneous availability; interval availability; operational lifetime; optimistic evaluation; stair-step approximation; steady-state availability; time-varying failure rate; Availability; Couplings; Exponential distribution; Failure analysis; Information technology; Probability density function; Shape; Steady-state; Sun; Time varying systems;

fLanguage

English

Publisher

ieee

Conference_Titel

Dependable Computing, 2001. Proceedings. 2001 Pacific Rim International Symposium on

Conference_Location

Seoul

Print_ISBN

0-7695-1414-6

Type

conf

DOI

10.1109/PRDC.2001.992722

Filename

992722