Title :
R4X/D4X-formatters for flexible test system architecture
Author :
Syed, Ahmed Rashid
Author_Institution :
NPTest Inc., San Jose, CA, USA
Abstract :
NPTest´s new R4X and D4X formatter ICs can provide formatted levels and timing markers at multiple frequencies, and can support up to four pin-electronics channels per device. This paper describes some of the major features and operation of these ICs.
Keywords :
automatic test equipment; digital integrated circuits; high-speed integrated circuits; 266 MHz; 33 MHz; D4X formatter IC; NPTest; R4X formatter IC; flexible test system architecture; formatted levels; four pin-electronics channels; multiple frequencies; timing markers; Circuit testing; Costs; Design engineering; Frequency; Hardware; Logic testing; Modems; Pins; System testing; Timing;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041843
