DocumentCode :
237835
Title :
Design of two-port verification devices for reflection measurement in waveguide vector network analyzers at millimeter and sub-millimeter wave frequencies
Author :
Horibe, Masahiro ; Kishikawa, Ryoko
Author_Institution :
Adv. Ind. Sci. & Technol., Nat. Metrol. Inst. of Japan, Tsukuba, Japan
fYear :
2014
fDate :
6-6 June 2014
Firstpage :
1
Lastpage :
6
Abstract :
Confidence of vector network analyzer (VNA) measurement can be established by verification process of measurements. The design role of waveguide verification devices has been developed for use at millimeter and sub-millimeter wave frequencies, up to 1.1 THz. Other research groups have also been studied the two port mismatch device for VNA system verification [1-3]. This paper describes design role of verification devices, and then both theoretical estimation and simulation results of verification device characteristics is explained. Furthermore, the measurement results of verification devices are shown in the WM-1651 (WR-6, 110 GHz - 170 GHz) frequency band.
Keywords :
millimetre wave devices; network analysers; submillimetre wave devices; test equipment; VNA system verification; frequency 110 GHz to 170 GHz; millimeter wave frequencies; reflection measurement; submillimeter wave frequencies; two-port verification devices; waveguide vector network analyzers; waveguide verification devices; Clamps; Frequency measurement; Reflection; Thickness measurement; Aperture dimensions; Flat frequency response of reflection characteristics; Reflection characteristics; Verification; Waveguide vector network analyzer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2014 83rd ARFTG
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/ARFTG.2014.6899510
Filename :
6899510
Link To Document :
بازگشت