DocumentCode
2378350
Title
High reliability MCM packaging using low stress liquid type epoxy resin by printing encapsulation systems (PES)
Author
Okuno, A. ; Nagai, Koichirou ; Fujita, Noriko ; Tsukasaki, Yoskitaka ; Oyama, Noritaka ; Nakahira, Kazuhiro ; Hashimoto, Tstmekazu
Author_Institution
Japan Rec Co., Ltd., Osaka, Japan
fYear
1994
fDate
1-4 May 1994
Firstpage
147
Lastpage
151
Abstract
MCML can expect to be the main current of semiconductor packaging technology in near future. BGA, PLCC and PGA packaging methods will expect much of this application. But the most pressing problem is warp after the packaging process. The warp after packaging needs to be below 150 μm at BGA and 100 μm at PLCC. We have already developed the Printing Encapsulation Systems (PES). PES is able to make low cost and mass produced semiconductor packaging. This paper describes the use of PES to make MCML semiconductor packaging. We have developed a low warp packaging epoxy resin using elastomer modified epoxy resin to fit BGA, PLCC and PGA. We verified the low stress epoxy resin using dynamic mechanical properties and internal stress measurements. We packaged BGA, PLCC and BGA with this low stress epoxy resin using PES, and measured the warp of each packaging. We obtained good results for the warp, demonstrating that using this low stress epoxy resin and PES, low cost and high reliability packaging of BGA, PLCC and PGA could be achieved
Keywords
circuit reliability; deformation; elastomers; encapsulation; internal stresses; microassembling; multichip modules; BGA; MCM assembly; MCM packaging; MCML; PGA; PLCC; elastomer modified epoxy resin; high reliability packaging; low stress liquid type epoxy resin; printing encapsulation systems; semiconductor packaging technology; warp reduction; Costs; Electronics packaging; Encapsulation; Epoxy resins; Internal stresses; Mechanical factors; Pressing; Printing; Semiconductor device packaging; Stress measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1994. Proceedings., 44th
Conference_Location
Washington, DC
Print_ISBN
0-7803-0914-6
Type
conf
DOI
10.1109/ECTC.1994.367638
Filename
367638
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