Title :
Efficient design of system test: a layered architecture
Author :
Baldini, Andrea ; Benso, Alfredo ; Prinetto, Paolo ; Mo, Sergio ; Taddei, Andrea
Author_Institution :
Dipt. di Automatica e Informatica, Politecnico di Torino, Italy
Abstract :
Starting from the idea of a general methodology to transform design specifications into system level functional test patterns for complex embedded systems, we propose a layered architecture as basis of such process. The architecture aims at strongly simplifying the test design, allowing the test engineer to concentrate on the high level parts of the system and wrapping all the complexity of the test environment. The results are then verified on a complex case study of automotive applications.
Keywords :
automatic test pattern generation; embedded systems; high level synthesis; logic testing; automotive applications; complex embedded systems; design specifications; high level parts; layered architecture; system level functional test patterns; system test; test environment; Automotive applications; Computer architecture; Design methodology; Embedded software; Embedded system; International collaboration; Magnetic materials; Research and development; System testing; Unified modeling language;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041848
