• DocumentCode
    237848
  • Title

    Active harmonic source-/load-pull measurements of AlGaN/GaN HEMTs at X-band frequencies

  • Author

    Maier, Thomas ; Carrubba, V. ; Quay, Ruediger ; van Raay, Friedbert ; Ambacher, Oliver

  • Author_Institution
    Fraunhofer Inst. for Appl. Solid State Phys. (IAF), Freiburg, Germany
  • fYear
    2014
  • fDate
    6-6 June 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Active harmonic loadpull measurements investigation for a 1-mm AlGaN/GaN HEMT power transistor at X-Band frequencies are in this paper reported. The paper highlights the transistor performances in terms of maximum PAE, POUT and Gain achieved at 8.7 GHz together with the application of a systematic source-/load-pull measurement procedure including wafer-mapping capability. The measurements were carried out using an active harmonic loadpull test system with four control loops. In particular, fundamental and second harmonic “loads” as well as second harmonic “source” terminations have been properly varied and optimized. The 1-mm GaN power device delivered very high efficiency of DE=71.2% and PAE=66.1%, together with high POUT and power gain of 35 dBm (3.2 W) and 11.5 dB, respectively.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; microwave power transistors; power HEMT; wide band gap semiconductors; HEMT power transistor; PAE; POUT; X-band; active harmonic load-pull measurement; active harmonic loadpull test system; active harmonic source-measurement; frequency 8.7 GHz; power 3.2 W; wafer-mapping; Atmospheric measurements; Gallium nitride; HEMTs; Particle measurements; Radio frequency; Tuners; Wireless communication; Active; efficiency; harmonic; loadpull; tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference (ARFTG), 2014 83rd ARFTG
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/ARFTG.2014.6899516
  • Filename
    6899516