• DocumentCode
    237854
  • Title

    Method for calibration vector signal analyzer based on baseband waveform design

  • Author

    Zhou Feng ; Zhang Rui ; Mu Dan ; Cheng Kai ; Xu Yu-chou ; Gao You-gang

  • Author_Institution
    China Acad. of Telecommun. Res., MIIT, Beijing, China
  • fYear
    2014
  • fDate
    6-6 June 2014
  • Firstpage
    1
  • Lastpage
    14
  • Abstract
    In this paper, we focus on the calibration on VSA, which consists three parts : 1. realization on the periodic continuity of baseband waves of finite-length digital modulated signals ; 2. fundamental error setting techniques based on error symbols design ; 3. technique of full error symbol frame, which assures that each symbol is present in the measurement on equal probability. This technique will alleviate the negative effects of stochastic symbol sequences on metrology measurement, and unify the measurement model and mathematical model. Our experiments have shown that this metrology method and system can : 1. continuously adjust the values of digital modulated errors in a large range, and set the expected digital modulated error parameters; 2. exhibit strong consistency of the measured value and calculated value for such digital-modulated parameters as EVM; 3. show good repeatability on the values of digital modulated parameters, 4. be widely applied to almost all digital modulation schemes, such as 256QAM or higher rank modulation scheme.
  • Keywords
    calibration; mathematical analysis; modulation; probability; signal generators; stochastic processes; vectors; 256QAM; EVM; VSA; baseband wave continuity; baseband waveform design; calibration vector signal analyzer; error vector magnitude; finite-length digital modulated signal error; full error symbol frame design; fundamental error setting technique; higher rank modulation scheme; mathematical model; metrology measurement; probability; signal generator; stochastic symbol sequence; Abstracts; Vectors; Calibration; EVM; Generator; VSA; Waveform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference (ARFTG), 2014 83rd ARFTG
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/ARFTG.2014.6899519
  • Filename
    6899519