Abstract :
The following topics are dealt with: computer system design; fault and error tolerance; tree construction; EDA; formal verification and testing; application-specific processing elements; processor architecture; clock distribution; network-on-chip; SoC, memory, and analog testing; application-specific systems; VLSI signal processing; simulation and reliability; multi-threaded and multi-core architectures; VLSI arithmetic; modeling, estimation, and simulation; multiprocessor and multi-core systems; energy-efficiency and security in processor designs; low power circuits; cache architectures; logic circuits.
Keywords :
VLSI; integrated circuit design; integrated circuit testing; logic circuits; logic design; logic testing; microprocessor chips; multiprocessing systems; system-on-chip; EDA; SoC testing; VLSI arithmetic; VLSI signal processing; analog testing; application-specific processing element; application-specific system; cache architecture; circuit reliability; circuit simulation; clock distribution; computer design; energy efficiency; error tolerance; fault tolerance; formal verification; logic circuit; low power circuit; memory testing; multicore architecture; multiprocessor system; multithreaded architecture; network-on-chip; processor architecture; processor design security; tree construction;
Conference_Titel :
Computer Design, 2008. ICCD 2008. IEEE International Conference on
Conference_Location :
Lake Tahoe, CA
Print_ISBN :
978-1-4244-2657-7
DOI :
10.1109/ICCD.2008.4751826
