Title :
A method for de-embedding cable flexure errors in S-parameter measurements
Author :
Mubarak, Faisal ; Rietveld, Gert ; Spirito, M.
Author_Institution :
Van Swinden Lab. (VSL), Delft, Netherlands
Abstract :
Errors due to inevitable cable flexure are one of the major error and uncertainty sources in high-precision S-parameter measurements. Recently developed two-port electronic calibration units allow for determination and correction of these errors. A method is presented where such a unit is applied to de-embed cable flexure errors in S-parameter measurements. In a series of steps, the effects of the cable as well as from the electronic calibration unit itself are determined and subsequently corrected for. First results show that using this method, cable flexure errors can be decreased with a factor of 5 to 10, with the most significant gain at the higher frequencies.
Keywords :
S-parameters; bending; cables (electric); calibration; measurement errors; measurement uncertainty; network analysers; VNA; deembedding cable flexure error method; high-precision S-parameter measurement; two-port electronic calibration unit; Calibration; Impedance; Impedance measurement; Measurement uncertainty; Scattering parameters; Semiconductor device measurement; Standards; PNA; RF; S-parameters; VNA; cable errors; cable flexure; de-embedding; impedance; measurement techniques;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2014 83rd ARFTG
Conference_Location :
Tampa, FL
DOI :
10.1109/ARFTG.2014.6899529