Title :
Fault tolerant Four-State Logic by using Self-Healing Cells
Author :
Panhofer, Thomas ; Friesenbichler, Werner ; Delvai, Martin
Author_Institution :
Austrian Aerosp. GmbH
Abstract :
The trend towards higher integration and faster operating speed leads to decreasing feature sizes and lower supply voltages in modern integrated circuits. These properties make the circuits more error-prone, requiring a fault tolerant implementation for applications demanding high reliability, e.g. space missions. In previous work we presented a concept how to obtain fault tolerant digital circuits by using asynchronous four-state logic (FSL). This type of logic already exhibits a high degree of fault tolerance where most faults simply halt the circuit (deadlock). The remaining types of faults are handled by temporal redundancy. Adding a deadlock detection unit and introducing the concept of self-healing cells (SHCs) leads to a highly reliable circuit that is able to tolerate even multiple faults. However our experiments revealed that some specific fault constellations neither cause a deadlock nor are they detected by a redundant calculation. We present two improved ways of error detection, which allow to capture even these types of faults. Further, a comparison between the size of an SHC and the achieved fault tolerance wrt. multiple faults is performed.
Keywords :
asynchronous circuits; fault tolerance; integrated circuit design; integrated circuit reliability; logic design; redundancy; asynchronous four-state logic; deadlock detection unit; digital circuit; error detection; fault tolerant digital circuit; integrated circuit reliability; self-healing cell; temporal redundancy; Circuit faults; Electrical fault detection; Fault detection; Fault tolerance; High speed integrated circuits; Integrated circuit reliability; Logic circuits; Space missions; System recovery; Voltage;
Conference_Titel :
Computer Design, 2008. ICCD 2008. IEEE International Conference on
Conference_Location :
Lake Tahoe, CA
Print_ISBN :
978-1-4244-2657-7
Electronic_ISBN :
1063-6404
DOI :
10.1109/ICCD.2008.4751832