DocumentCode
2378832
Title
Multilevel inverter modulation schemes to eliminate common-mode voltages
Author
Zhang, Haoran ; Von Jouanne, Annette ; Wallace, Alan
Author_Institution
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Volume
1
fYear
1998
fDate
12-15 Oct. 1998
Firstpage
752
Abstract
It is well known that conventional two-level pulse-width modulated (PWM) inverters generate high frequency common-mode voltages with high dv/dt. Similarly, commonly used multilevel inverter modulation schemes generate common-mode voltages. Common-mode voltages may cause motor shaft voltages and bearing currents and conducted electromagnetic interference (EMI). Premature motor bearing failures and electronic equipment malfunctions have been reported to be directly related to bearing currents and EMI. In this paper, approaches to eliminating common-mode voltage when using multilevel PWM inverters are presented. It is shown that inverters, which have an odd number of levels, will generate zero common-mode voltage by switching among certain states. Therefore motor bearing currents will be eliminated and conducted EMI will be reduced. Both sine-triangle intersection modulation (SPWM) and space-vector modulation (SVM) schemes are discussed and detailed comparative simulation results between conventional and novel modulation schemes are provided.
Keywords
AC motor drives; PWM invertors; electromagnetic interference; interference suppression; machine bearings; EMI reduction; bearing currents; common-mode voltages elimination; conducted electromagnetic interference; electronic equipment malfunctions; motor shaft voltages; multilevel inverter modulation; premature motor bearing failures; sine-triangle intersection modulation; space-vector modulation; switching; two-level PWM inverters; zero common-mode voltage; Couplings; Electromagnetic interference; Electrostatics; Pulse generation; Pulse inverters; Pulse width modulation inverters; Rotors; Shafts; Stator windings; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
Conference_Location
St. Louis, MO, USA
ISSN
0197-2618
Print_ISBN
0-7803-4943-1
Type
conf
DOI
10.1109/IAS.1998.732411
Filename
732411
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