DocumentCode
2378885
Title
Can IC test learn from how a tester is tested
Author
Rajsuman, Rochit
Author_Institution
Advantest America R & D Center Inc., Santa Clara, CA, USA
fYear
2002
fDate
2002
Firstpage
1186
Abstract
Summary form only given. A tester as well as an IC is a system at different abstraction levels. The testing of each of these systems should contain individual component testing as well as a full system level functional test to ensure its functional correctness. A full functional test of IC should be done regardless of the fault coverage of individual blocks and test methodology including DFT, structural test, Iddq etc. The interfaces and synergy in the operation of blocks can only be determined by functional test.
Keywords
automatic testing; integrated circuit testing; IC test; component testing; functional test; Application specific integrated circuits; Assembly; Computational modeling; Electronic equipment testing; Hardware; Integrated circuit modeling; Integrated circuit testing; Software design; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041894
Filename
1041894
Link To Document