Title :
Is it rocket science?
Author :
Ambler, Anthony P.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Abstract :
Summary form only given. This article gives a general overview of system test. Topics covered include: chip test; board test; integrated system test; high integrity/value systems; field service; diagnostics; false failures; and spares.
Keywords :
electronic equipment testing; integrated circuit testing; maintenance engineering; printed circuit testing; program diagnostics; board test; chip test; diagnostics; electronic equipment test; false failures; field service; high integrity/value systems; integrated system test; spares; system test general overview; Costs; Customer satisfaction; Pipelines; Rockets; System testing; Time factors;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041896
