• DocumentCode
    2378948
  • Title

    Structuration of Semiconducting Polymer Thin Films by Nanorubbing

  • Author

    Derue, Gwennaelle ; Gabriele, Sylvain ; Monteverde, Fabien ; Coppé, Séverine ; Damman, Pascal ; Surin, Mathieu ; Geskin, Victor ; Leclère, Philippe ; Lazzaroni, Roberto

  • Author_Institution
    Lab. de Physicochimie des Polymeres, Univ. de Mons-Hainaut, Mons
  • fYear
    2006
  • fDate
    6-10 Nov. 2006
  • Firstpage
    4882
  • Lastpage
    4887
  • Abstract
    In this paper, we study the behavior of thin films of a semiconducting polymer, poly(3-hexylthiophene)-P3HT under the application of a physical constraint. We have rubbed P3HT thin films with a velvet cloth, which leads to the alignment of the polymer chains along the sliding direction at the film surface. Annealing the rubbed films up to the crystallization temperature, leads to the propagation of the surface orientation to the whole film. In order to gain spatial and geometrical control on the rubbing process, we have used nano-rubbing. Using the stylus of an AFM working in contact mode, the nano-rubbing process can be performed locally on an area of defined size. These chain-aligned structures can be permanent thanks to the crystallization process. This study opens interesting opportunities to control the molecular order within the channel of field-effect transistors
  • Keywords
    abrasion; nanotechnology; polymer films; semiconductor thin films; chain-aligned structures; crystallization temperature; field-effect transistors; film surface; nanorubbing; poly(3-hexylthiophene); semiconducting polymer thin films structuration; surface orientation propagation; Atomic force microscopy; Crystallization; Dip coating; Optical films; Optical polarization; Polymer films; Semiconductivity; Semiconductor films; Semiconductor thin films; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE Industrial Electronics, IECON 2006 - 32nd Annual Conference on
  • Conference_Location
    Paris
  • ISSN
    1553-572X
  • Print_ISBN
    1-4244-0390-1
  • Type

    conf

  • DOI
    10.1109/IECON.2006.347972
  • Filename
    4153759