Title :
Inevitable use of TAP domains in SOCs
Author_Institution :
Texas Instruments, USA
Abstract :
This paper discusses the use of test access ports (TAPs) in systems-on-chip (SOC). Topics covered include: IEEE 1149.1, IEEE P1500 and associated standards; TAP controllers; TAP protocols; SOC multiple TAP domains; self-checking; embedded core test standards; core test wrapper architecture; and serial/parallel access test mechanisms.
Keywords :
IEEE standards; automatic testing; computer interfaces; embedded systems; integrated circuit testing; logic testing; protocols; system-on-chip; IC test; IEEE 1149.1; IEEE P1500; SOC; TAP controllers; core test wrapper architecture; embedded core test standards; multiple test access port domains; protocols; self-checking; serial/parallel access test mechanisms; systems-on-chip; Bandwidth; Chapters; Computer architecture; Digital integrated circuits; Emulation; Instruments; Integrated circuit testing; Plugs; Protocols; Silicon;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041898
