DocumentCode :
2379140
Title :
Mixed signal BIST: fact or fiction
Author :
Song, Lee Y.
Author_Institution :
Teradyne Inc., Agoura Hills, CA, USA
fYear :
2002
fDate :
2002
Firstpage :
1203
Abstract :
Is mixed-signal BIST a viable, general-purpose test solution? Many of today´s SoC devices embed complex analog and mixed-signal cores, and some in the industry have seen mixed-signal BIST as one of the most promising potential solutions. Nonetheless, mixed-signal BIST is far from a general-purpose solution and will remain an ad-hoc solution in the foreseeable future. But because of increasing demands on mixed-signal core testing and the drive to lower the cost of test, the use of mixed-signal BIST will grow, both as an alternative and supplement to traditional mixed signal test methods.
Keywords :
automatic test equipment; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; system-on-chip; SoC devices; ad-hoc solution; complex analog cores; complex mixed-signal cores; core testing; general-purpose test solution; mixed signal BIST; Analog circuits; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Equations; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2002. Proceedings. International
ISSN :
1089-3539
Print_ISBN :
0-7803-7542-4
Type :
conf
DOI :
10.1109/TEST.2002.1041909
Filename :
1041909
Link To Document :
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