Title :
Mission impossible? Open architecture ATE
Author :
Conti, Dennis R.
Author_Institution :
IBM Microelectron. Div., Essex Junction, VT, USA
Abstract :
Summary form only given. A premise behind the open architecture system is to have a single set of hardware and software standards across the test industry, allowing instrumentation to be exchanged between ATE supplier boundaries. This paper asks whether the ATE suppliers will cooperate to set and maintain these standards while maintaining competition, and if not, looks at whether there is a sufficient number of third party suppliers to support multiple open architectures.
Keywords :
automatic test equipment; electronic equipment manufacture; open systems; standards; ATE standards; ATE supplier boundaries; ATE supplier competition; ATE supplier cooperation; hardware standards; instrumentation exchange; multiple open architectures; open architecture ATE; software standards; test industry; third party suppliers; Computer architecture; Computer industry; Costs; Hardware; Instruments; Microelectronics; Rivers; Software standards; Software testing; System testing;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041912