• DocumentCode
    2379257
  • Title

    The consequences of an open ATE architecture

  • Author

    Perez, Sergio M.

  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1210
  • Abstract
    Summary form only given. It is clear that the time for a common, open ATE has arrived. The high level of technology integration and modularity make an open architecture feasible. The technical and economic challenges involved in testing system-on-a-chip (SoC) designs provide the needed driving force to make the common, open ATE architecture not only feasible but also highly desirable. Deployment of the common, open ATE architecture will require the active involvement of all the significant industry participants, a common objective for a more efficient industry and a strong sense of urgency.
  • Keywords
    automatic test equipment; design engineering; electronic equipment manufacture; integrated circuit design; integrated circuit economics; integrated circuit technology; integrated circuit testing; open systems; system-on-chip; economic challenges; industry efficiency; industry participants; modularity; open ATE architecture; system-on-a-chip design testing; technical challenges; technology integration; Companies; Computer architecture; Computer languages; Engineering profession; Hardware; Open source software; Power supplies; Production systems; Timing; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2002. Proceedings. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7542-4
  • Type

    conf

  • DOI
    10.1109/TEST.2002.1041915
  • Filename
    1041915