DocumentCode
2379257
Title
The consequences of an open ATE architecture
Author
Perez, Sergio M.
fYear
2002
fDate
2002
Firstpage
1210
Abstract
Summary form only given. It is clear that the time for a common, open ATE has arrived. The high level of technology integration and modularity make an open architecture feasible. The technical and economic challenges involved in testing system-on-a-chip (SoC) designs provide the needed driving force to make the common, open ATE architecture not only feasible but also highly desirable. Deployment of the common, open ATE architecture will require the active involvement of all the significant industry participants, a common objective for a more efficient industry and a strong sense of urgency.
Keywords
automatic test equipment; design engineering; electronic equipment manufacture; integrated circuit design; integrated circuit economics; integrated circuit technology; integrated circuit testing; open systems; system-on-chip; economic challenges; industry efficiency; industry participants; modularity; open ATE architecture; system-on-a-chip design testing; technical challenges; technology integration; Companies; Computer architecture; Computer languages; Engineering profession; Hardware; Open source software; Power supplies; Production systems; Timing; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041915
Filename
1041915
Link To Document