Title :
The consequences of an open ATE architecture
Author :
Perez, Sergio M.
Abstract :
Summary form only given. It is clear that the time for a common, open ATE has arrived. The high level of technology integration and modularity make an open architecture feasible. The technical and economic challenges involved in testing system-on-a-chip (SoC) designs provide the needed driving force to make the common, open ATE architecture not only feasible but also highly desirable. Deployment of the common, open ATE architecture will require the active involvement of all the significant industry participants, a common objective for a more efficient industry and a strong sense of urgency.
Keywords :
automatic test equipment; design engineering; electronic equipment manufacture; integrated circuit design; integrated circuit economics; integrated circuit technology; integrated circuit testing; open systems; system-on-chip; economic challenges; industry efficiency; industry participants; modularity; open ATE architecture; system-on-a-chip design testing; technical challenges; technology integration; Companies; Computer architecture; Computer languages; Engineering profession; Hardware; Open source software; Power supplies; Production systems; Timing; Vehicles;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041915