DocumentCode :
2379321
Title :
The yield of test outsourcing
Author :
Appello, Davide
Author_Institution :
STMicroelectronics, Italy
fYear :
2002
fDate :
2002
Firstpage :
1215
Abstract :
Summary form only given. Many ways to outsource test activities has been explored recently. Often subcontractors have been employed to design portion of devices or entire circuits. Often it is also discovered that transferring DFT and test methodologies outside the originating company is critical. The efficiency of test development, and also the quality of product test can be affected. Reaching the target coverage is not the only problem. Defining how to exchange test data and the handoff step in the flow is another crucial issue. Similar problems arise also when outsourcing concerns the ATE test program development. In such cases the risk is loosing the possibility to gain important expertise and skills, for example, concerning critical technology-dependant features of the device. In conclusion, the major concerns are for the diagnostic capabilities that test and DFT should provide. In this perspective, the impact of test outsourcing could really be significant, especially on the test-manufacturing environment, and on the effectiveness of the test data coming from it.
Keywords :
automatic testing; design for testability; integrated circuit manufacture; integrated circuit testing; outsourcing; production testing; ATE test program development; DFT; diagnostic capabilities; product test quality; subcontracting; target coverage; test data effectiveness; test development; test methodologies; test outsourcing; test-manufacturing environment; Circuit testing; Crisis management; Design for testability; Joining processes; Manufacturing; Memory management; Outsourcing; Protection; Random access memory; Subcontracting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2002. Proceedings. International
ISSN :
1089-3539
Print_ISBN :
0-7803-7542-4
Type :
conf
DOI :
10.1109/TEST.2002.1041919
Filename :
1041919
Link To Document :
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