Title :
Test and repair of non-volatile commodity and embedded memories (NAND flash memory)
Author :
Shirota, Riichiro
Author_Institution :
Semicond. Co., Toshiba Corp., Yokohama, Japan
Abstract :
Summary form only given. The test time of the memory chip is a very important issue. It mainly depends on the program and erase time. NAND flash memories perform high speed programming and erasing. This high speed reprogramming scheme reduces the test cost. The program/erase endurance reliability is another important test issue. In order to perform at high reliability, NAND flash memories use ECC technology. Using ECC technology, multi-level as well as single-level NAND flash memories perform with high endurance reliabilities.
Keywords :
NAND circuits; flash memories; integrated circuit reliability; integrated circuit testing; integrated memory circuits; logic testing; ECC technology; NAND flash memories; high reliability memories; high speed erasing; high speed programming; memory chip testing; nonvolatile commodity memories; nonvolatile embedded memories; program/erase endurance reliability; test cost reduction; test time; Electrons; Error correction codes; Nonvolatile memory; Semiconductor device testing;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041924
