Title :
Highly reliable A/D converter using analog voting
Author :
Namazi, A. ; Askari, S. ; Nourani, M.
Author_Institution :
Center for Integrated Circuits & Syst., Univ. of Texas at Dallas, Richardson, TX
Abstract :
Analog and digital circuits are both prone to failure due to transient upsets, variations, etc. Redundancy techniques, such as N-tuple Modular Redundancy, has been widely used to correct faulty behavior of components and achieve high reliability for digital circuits, whereas, not much has been done on the analog side. In this paper, we propose a redundancy based fault-tolerant methodology to design a highly reliable analog to digital converters (ADC). Our methodology employs redundant analog blocks and chooses the best result using an innovative analog voter. Experimental results are reported to verify the concepts, measure the systempsilas reliability and tradeoff reliability versus cost and power.
Keywords :
analogue-digital conversion; circuit reliability; fault tolerance; A/D converter; N-tuple modular redundancy; analog blocks; analog to digital converters; analog voting; fault-tolerant methodology; redundancy techniques; Analog-digital conversion; Circuit faults; Costs; Design methodology; Digital circuits; Fault tolerance; Power measurement; Power system reliability; Redundancy; Voting; Analog Circuit; Analog Voter; Defect-Tolerance; Fault-Tolerance; Majority Voting; Median Voting; NMR; Redundancy; Reliability;
Conference_Titel :
Computer Design, 2008. ICCD 2008. IEEE International Conference on
Conference_Location :
Lake Tahoe, CA
Print_ISBN :
978-1-4244-2657-7
Electronic_ISBN :
1063-6404
DOI :
10.1109/ICCD.2008.4751882