Title :
"Board test and ITC: what does the future hold?"
Author_Institution :
Bennetts Associates
Keywords :
Automatic testing; Backplanes; Delay; Manufacturing; Packaging; Prototypes; Semiconductor device measurement; Switches; System testing; Technological innovation;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041935
