DocumentCode :
2379624
Title :
Mushroom-Free Selective Epitaxial Growth of Si, SiGe and SiGe:B Raised Sources and Drains on FD-SOI MOSFETs
Author :
Hartmann, J.-M. ; Benevent, V. ; Barnes, J.P. ; Veillerot, M. ; Lafond, D. ; Damlencourt, J.F. ; Loubet, N. ; Dutartre, D.
Author_Institution :
LETI, CEA, Grenoble, France
fYear :
2012
fDate :
4-6 June 2012
Firstpage :
1
Lastpage :
2
Abstract :
Heavily chlorinated chemistries deliver the selectivity (versus Si3N4 sidewall spacers) which is required to grow Si or SiGe(:B) raised sources and drains (RSDs) on each side of n-type and p-type fully depleted-silicon on insulator MOSFETs. We are however faced with the formation of mushrooms that use as seeds the poly-Si layers sitting on top of unprotected gates (by for instance a SiO2 hard mask). Those mushrooms will hamper ion implantation close to the channel (and merge for dense devices such as Static Random Access Memory cells), as illustrated in Figure 1 for 23 nm thick Si raised sources and drains grown at 750°C, 20 Torr with SiH2Cl2 + HCl (J. Cryst. Growth 280, 530 (2005)).
Keywords :
Ge-Si alloys; MOSFET; elemental semiconductors; epitaxial growth; ion implantation; semiconductor growth; silicon; silicon-on-insulator; FD-SOI MOSFET; Si; SiGe:B; ion implantation; mushroom-free selective epitaxial growth; n-type fully depleted-silicon on insulator MOSFET; p-type fully depleted-silicon on insulator MOSFET; pressure 20 torr; raised sources-drains; size 23 nm; static random access memory cells; temperature 750 degC; Epitaxial growth; Logic gates; MOSFETs; Silicon; Silicon germanium; Strain; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon-Germanium Technology and Device Meeting (ISTDM), 2012 International
Conference_Location :
Berkeley, CA
Print_ISBN :
978-1-4577-1864-9
Electronic_ISBN :
978-1-4577-1863-2
Type :
conf
DOI :
10.1109/ISTDM.2012.6222454
Filename :
6222454
Link To Document :
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