Title :
Is board test worth talking about?
Author_Institution :
Cisco Systems, Inc.
Keywords :
Circuit faults; Circuit testing; Contracts; High speed optical techniques; Integrated circuit testing; Logic testing; Manufacturing; Probes; Radio frequency; System testing;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041936