DocumentCode
2379633
Title
Is board test worth talking about?
Author
Eklow, Bill
Author_Institution
Cisco Systems, Inc.
fYear
2002
fDate
2002
Firstpage
1235
Lastpage
1235
Keywords
Circuit faults; Circuit testing; Contracts; High speed optical techniques; Integrated circuit testing; Logic testing; Manufacturing; Probes; Radio frequency; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041936
Filename
1041936
Link To Document