مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2379673

Title :

Is ITC bored with board test?

Author :

Butler, Kenneth M.

Author_Institution :

Texas Instruments Inc.

fYear :

2002

fDate :

2002

Firstpage :

1237

Lastpage :

1237

Keywords :

Application specific integrated circuits; Educational institutions; Instruments; Manufacturing; Mobile handsets; Optimized production technology; Standards Board; System-on-a-chip; Telephone sets; Testing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 2002. Proceedings. International

ISSN :

1089-3539

Print_ISBN :

0-7803-7542-4

Type :

conf

DOI :

10.1109/TEST.2002.1041938

Filename :

1041938

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2379673