DocumentCode :
2379679
Title :
Recent Progress of Germanium Gate Stack Technology
Author :
Toriumi, Akira ; Lee, Choong Hyun ; Tabata, Toshiyuki ; Wang, Shengkai ; Zhao, Dandan ; Nishimura, Tomonori ; Kita, Koji ; Nagashio, Kosuke
Author_Institution :
Dept. of Mater. Eng., Univ. of Tokyo, Tokyo, Japan
fYear :
2012
fDate :
4-6 June 2012
Firstpage :
1
Lastpage :
2
Abstract :
Ge technology is obviously not new, but its recent progress is in marked contrast to the past research and is based on deep understanding of materials science in Ge (1). Ge CMOS is quite interesting not only from the high mobility but also from CMOS compactness rather than "III-V for n-MOS and Ge for p-MOS". From the EOT scalability viewpoint, sub-nm EOT gate stacks are required to keep the intrinsically high performance of Ge. GeOx-free gate stacks will be another advantage of Ge by choosing appropriate high-k dielectrics. Furthermore, we can expect versatile device opportunities and applications more suitable for Ge such as pure metal source/drain FETs or junction-less FETs.
Keywords :
CMOS integrated circuits; elemental semiconductors; germanium; high-k dielectric thin films; CMOS circuit; EOT gate stacks; EOT scalability viewpoint; Ge; Germanium Gate Stack Technology; high-k dielectrics; junctionless FET; metal source-drain FET; n-MOS type; p-MOS type; CMOS integrated circuits; Electron mobility; FETs; High K dielectric materials; Logic gates; MOSFET circuits; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon-Germanium Technology and Device Meeting (ISTDM), 2012 International
Conference_Location :
Berkeley, CA
Print_ISBN :
978-1-4577-1864-9
Electronic_ISBN :
978-1-4577-1863-2
Type :
conf
DOI :
10.1109/ISTDM.2012.6222458
Filename :
6222458
Link To Document :
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