Title :
Panel: "board test and ITC: what does the future hold?"
Author :
Lobetti-Bodoni, Monica
Author_Institution :
Siemens Mobile Communication
Keywords :
Automatic testing; Circuit testing; Consumer electronics; Design engineering; Electronic equipment testing; Manufacturing; Mobile communication; Production; System testing; Technological innovation;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041940