Author :
Goji Etoh, T. ; Poggemann, D. ; Ruckelshausen, A. ; Theuwissen, A. ; Kreider, G. ; Folkerts, H.-O. ; Mutoh, H. ; Kondo, Y. ; Maruno, H. ; Takubo, K. ; Soya, H. ; Takehara, K. ; Okinaka, T. ; Takano, Y. ; Reisinger, T. ; Lohmann, C.
Abstract :
A single-chip CCD image sensor captures >100 successive images at >1 Mframes/s. The pixel count of the test chip is 312/spl times/260 (=81,120) pixels. Charge handling capacity is 40 k electrons. Grey levels are 10 b. Fill factor is 13%. An on-chip overwriting mechanism makes possible continuous recording of the latest image signals, draining the old ones to the substrate.
Keywords :
CCD image sensors; image sequences; integrated circuit design; integrated circuit testing; 260 pixel; 312 pixel; 81120 pixel; CCD image sensor; charge handling capacity; continuous image capturing; continuous image signal recording; fill factor; grey levels; on-chip overwriting mechanism; single-chip CCD image sensor; successive image capture; test chip pixel count; Charge coupled devices; Charge-coupled image sensors; Image generation; Image sensors; Image storage; Intersymbol interference; Pixel; Signal generators; Solid state circuits; Switches;
