Title :
Fault measure of discrete event systems using probabilistic timed automata
Author :
Huang, Yi-Sheng ; Chiang, Ho-Shan ; Jeng, MuDer
Author_Institution :
Dept. of Electr. Eng., Nat. Ilan Univ., Ilan, Taiwan
Abstract :
A novel approach for probabilistic timed structure that is based on combining the formalisms of timed automata and probabilistic automata representation of the system is proposed. This paper presents an algorithm that combines probability measure and clock variables constructed model. Hence, their real-valued clocks can measure the passage of time and transitions can be probabilistic such that it can be expressed as a discrete probability distribution on the set of target states. The usage of clock variables and the specification of state space are illustrated with real value time applications. The transitions between states are probabilistic by events which describe either the occurrence of faults or normal working conditions. Additionally, the passage of discrete time and transitions can be probabilistic by mean of the theory of expectation sets to obtain a unified measure reasoning strategy. Finally, an example where a probabilistic time model is used to measure a robot of a system is also presented.
Keywords :
discrete event systems; fault tolerant computing; probabilistic automata; clock variables constructed model; discrete event systems; discrete probability distribution; expectation sets; fault measure; probabilistic timed automata; real value time applications; real-valued clocks; state space specification; unified measure reasoning strategy; Automata; Clocks; Formal languages; Maintenance engineering; Probabilistic logic; Sea measurements; discrete-event systems; fault measure; probabilistic timed automaton;
Conference_Titel :
Systems, Man, and Cybernetics (SMC), 2011 IEEE International Conference on
Conference_Location :
Anchorage, AK
Print_ISBN :
978-1-4577-0652-3
DOI :
10.1109/ICSMC.2011.6083864