• DocumentCode
    2380433
  • Title

    Two dimensional highly associative level-two cache design

  • Author

    Chuanjun Zhang ; Xue, Bing

  • Author_Institution
    Dept. of Comput. Sci. & Electr. Eng., Univ. of Missouri-Kansas City, Kansas City, MO
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    679
  • Lastpage
    684
  • Abstract
    High associativity is important for level-two cache designs [9]. Implementing CAM-based highly associative caches (CAM-HAC), however, is both costly in hardware and exhibits poor scalability. We propose to implement the CAM-HAC in macro-blocks to improve scalability. Each macro-block contains 128-row and 8-column of cache blocks. We name it Two dimensional Cache, or T-Cache. Each macro-block has an associativity equivalent to 128times8=1024-way. Twelve bits of the T-Cachepsilas tag are implemented by using CAM, while the remaining tag uses SRAM; Furthermore, random replacement is used in rows to balance cache sets usage while LRU is used in columns to select the victim from a row. The hardware complexity for replacement is reduced greatly compared to a traditional CAM-HAC using LRU solely. Experimental results show that the T-Cache achieves a 16% miss rate reduction over a traditional 8-way unified L2 cache. This translates into an average IPC improvement of 5% and as high as 18%. The T-Cache exhibits a 4% total memory access-related energy savings due to the reduction to applicationspsila execution time.
  • Keywords
    SRAM chips; cache storage; content-addressable storage; CAM-HAC; SRAM; content addressable memory; least recently used replacement; two dimensional highly associative level-two cache design; CADCAM; Cities and towns; Computer aided manufacturing; Computer science; Costs; Hardware; Random access memory; Routing; Scalability; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design, 2008. ICCD 2008. IEEE International Conference on
  • Conference_Location
    Lake Tahoe, CA
  • ISSN
    1063-6404
  • Print_ISBN
    978-1-4244-2657-7
  • Electronic_ISBN
    1063-6404
  • Type

    conf

  • DOI
    10.1109/ICCD.2008.4751934
  • Filename
    4751934