DocumentCode
2380703
Title
Analysis of epigenetic modifications by next generation sequencing
Author
Liang, Shoudan ; Lu, Yue ; Jelinek, Jaroslav ; Estecio, Marcos ; Li, Hao ; Issa, Jean-Pierre
Author_Institution
Dept. of Bioinf. & Comput. Biol., Univ. of Texas M. D. Anderson Cancer Center, Houston, TX, USA
fYear
2009
fDate
3-6 Sept. 2009
Firstpage
6730
Lastpage
6730
Abstract
In plants and animals, gene expression can be altered by changes not to DNA itself but rather chemical modifications either to DNA or to histones that interact with DNA. These so called epigenetic modifications persist through cell cycle. Rapidly advancing technologies, such next generation DNA sequencing, have dramatically increased our ability to survey epigenetic markers genomewide. These techniques are revealing in great details massive epigenetic changes in cancer. Analysis of next generation sequencing data present a formidable computational challenge. We will discuss methods to address these challenges in the context of analyzing histone modifications and DNA methylation data. Several techniques useful in epigenetic data analysis will be discussed, mapping tags to reference genome incorporating all known SNPs, analysis of chIP-seq data, as well as restriction enzyme-based DNA methylation analysis.
Keywords
DNA; bioinformatics; cancer; cellular biophysics; genomics; molecular biophysics; DNA chemical modifications; DNA methylation data; cancer epigenetic changes; chIP-seq data analysis; epigenetic markers; epigenetic modification analysis; gene expression alteration; histone chemical modifications; histone modification data; next generation DNA sequencing; restriction enzyme based DNA methylation analysis; single nucleotide polymorphism; Animals; Chromatin Immunoprecipitation; DNA Methylation; Epigenesis, Genetic; Genome; Polymorphism, Single Nucleotide; Restriction Mapping; Sequence Analysis, DNA;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location
Minneapolis, MN
ISSN
1557-170X
Print_ISBN
978-1-4244-3296-7
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2009.5332853
Filename
5332853
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