DocumentCode
2380734
Title
High-performance and damage-free neutral beam etching
Author
Samukawa, Seiji ; Sakamoto, Keisuke ; Ichiki, Katsunori
Author_Institution
Inst. of Fluid Sci., Tohoku Univ., Miyagi, Japan
fYear
2002
fDate
2002
Firstpage
126
Lastpage
129
Abstract
We propose high efficient neutral beam generation by using negative ions in a neutral beam source. We found that high flux and low energy neutral beams could be generated by efficiently neutralizing negative ions in the pulsed ICP passing through a carbon plate having high aspect ratio apertures. We expect that accurate, damage-free etching processes can be achieved by using our newly developed neutral beam generation system.
Keywords
plasma sources; sputter etching; damage-free neutral beam etching; high-performance neutral beam etching; negative ion neutralization; neutral beam generation; neutral beam source; pulsed ICP; Acceleration; Apertures; Electrons; Etching; Particle beams; Plasma accelerators; Plasma applications; Plasma measurements; Plasma sources; Plasma x-ray sources;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma- and Process-Induced Damage, 2002 7th International Symposium on
Print_ISBN
0-9651577-7-6
Type
conf
DOI
10.1109/PPID.2002.1042625
Filename
1042625
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