• DocumentCode
    2380734
  • Title

    High-performance and damage-free neutral beam etching

  • Author

    Samukawa, Seiji ; Sakamoto, Keisuke ; Ichiki, Katsunori

  • Author_Institution
    Inst. of Fluid Sci., Tohoku Univ., Miyagi, Japan
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    126
  • Lastpage
    129
  • Abstract
    We propose high efficient neutral beam generation by using negative ions in a neutral beam source. We found that high flux and low energy neutral beams could be generated by efficiently neutralizing negative ions in the pulsed ICP passing through a carbon plate having high aspect ratio apertures. We expect that accurate, damage-free etching processes can be achieved by using our newly developed neutral beam generation system.
  • Keywords
    plasma sources; sputter etching; damage-free neutral beam etching; high-performance neutral beam etching; negative ion neutralization; neutral beam generation; neutral beam source; pulsed ICP; Acceleration; Apertures; Electrons; Etching; Particle beams; Plasma accelerators; Plasma applications; Plasma measurements; Plasma sources; Plasma x-ray sources;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma- and Process-Induced Damage, 2002 7th International Symposium on
  • Print_ISBN
    0-9651577-7-6
  • Type

    conf

  • DOI
    10.1109/PPID.2002.1042625
  • Filename
    1042625