• DocumentCode
    2380912
  • Title

    High-Q FBAR filters in a wafer-level chip-scale package

  • Author

    Ruby, R.C. ; Barfknecht, A. ; Han, C. ; Desai, Y. ; Geefay, F. ; Gan, G. ; Gat, M. ; Verhoeven, T.

  • Author_Institution
    Agilent, Newark, CA, USA
  • Volume
    1
  • fYear
    2002
  • fDate
    7-7 Feb. 2002
  • Firstpage
    184
  • Abstract
    Wafer-level chip-scale packaged RF filters use thin-film bulk acoustic resonator technology. The 1/spl times/1mm/sup 2/ high-Q filter is hermetically sealed as two thin layers of silicon. The full-band 1900 MHz Tx filter mounted in a PCS power module has a 12 MHz roll-off, and replaces external split-band SAW filters and their accompanying switches.
  • Keywords
    acoustic resonator filters; chip scale packaging; elemental semiconductors; silicon; thin film devices; 12 MHz; 12 MHz roll-off; 1900 MHz; CDMA power modules; Si layers; chip-scale packaged RF filters; external split-band SAW filters; high-Q FBAR filters; high-Q filter; microcap; thin-film bulk acoustic resonator; wireless communication; wireless components; Chip scale packaging; Film bulk acoustic resonators; Hermetic seals; Multichip modules; Personal communication networks; Radio frequency; Resonator filters; Silicon; Transistors; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-7335-9
  • Type

    conf

  • DOI
    10.1109/ISSCC.2002.992997
  • Filename
    992997