A free-space method for measurement of complex permittivity of double-layer dielectric materials at microwave frequencies

Author

Zaki, Fatimah Audah Md ; Awang, Zaiki ; Baba, Noor Hasimah ; Zoolfakar, Ahmad Sabirin ; Abu Bakar, Raudah ; Zolkapli, Maizatul ; Fadzlina, N.

Author_Institution

Fac. of Electr. Eng., Univ. Teknol. MARA, Shah Alam, Malaysia

fYear

2010

fDate

13-14 Dec. 2010

Firstpage

12

Lastpage

15

Abstract

Two methods for the calculation of complex permittivity of double-layer dielectric materials measured by a spot-focusing free-space measurement system have been developed. Standard materials have been used to test these methods and further works will be carried out on SiO₂ wafer. The dielectric constants obtained were close to the published values. The two methods developed are Transmission Method and Metal-Backed Method. The S₁₁, S₂₁, and S₂₂ are measured for Transmission Method, while only S₁₁ is measured for Metal-Backed Method. In both methods, the samples are sandwiched between two Teflon plates which are quarter wavelength at mid-band frequency. Results are reported in the frequency range of 18-26GHz.κ

Keywords

dielectric materials; microwave measurement; permittivity measurement; complex permittivity measurement; double-layer dielectric materials; free-space method; frequency 18 GHz to 26 GHz; metal-backed method; microwave frequencies; transmission method; double-layer samples; free-space measurement; metal-backed method; spot-focusing horn lens antenna; transmission method;

fLanguage

English

Publisher

ieee

Conference_Titel

Research and Development (SCOReD), 2010 IEEE Student Conference on

Conference_Location

Putrajaya

Print_ISBN

978-1-4244-8647-2

Type

conf

DOI

10.1109/SCORED.2010.5703961

Filename

5703961