Title : 
A framework for evaluating network optimization techniques
         
        
            Author : 
Younis, Ossama ; Ghetie, Andrei ; Eswaran, Sharanya ; Goldberg, Noam ; Samtani, Sunil ; Varshney, Maneesh ; Patel, Mitesh
         
        
            Author_Institution : 
Appl. Commun. Sci., Inc. (ACS), Piscataway, NJ, USA
         
        
        
        
        
        
            Abstract : 
There is little understanding about how network applications can benefit from mathematical/heuristic optimization techniques, such as cross-layer design. We propose CLASS, a component-based framework for evaluating and comparing network optimization techniques, such as cross-layer design. CLASS uniquely integrates network optimization with high-fidelity simulation to provide an “optimize-and-verify” loop to network designers. Within CLASS framework, we propose two optimization algorithms. One algorithm (ROCA) jointly optimizes routing and channel assignment for cognitive-radio networks. The other algorithm (Flow-Aware Routing or FAR) jointly optimizes routes and MAC schedules in single-channel networks. Both algorithms exploit spatial diversity by reusing channels or slots. We discuss the benefits and applicability of both algorithms in the context of surveillance applications.
         
        
            Keywords : 
channel allocation; cognitive radio; heuristic programming; optimisation; radio networks; scheduling; telecommunication network routing; CLASS component-based framework; FAR; MAC scheduling; ROCA; channel assignment; cognitive-radio networks; cross-layer design; flow-aware routing; high-fidelity simulation; mathematical-heuristic optimization techniques; network optimization techniques; optimize-and-verify loop; single-channel networks; spatial diversity; Algorithm design and analysis; Delay; Interference; Optimization; Routing; Throughput; MANET design; TDMA scheduling; channel assignment; cross-layer design; evaluation framework; routing;
         
        
        
        
            Conference_Titel : 
Sarnoff Symposium (SARNOFF), 2012 35th IEEE
         
        
            Conference_Location : 
Newark, NJ
         
        
            Print_ISBN : 
978-1-4673-1465-7
         
        
        
            DOI : 
10.1109/SARNOF.2012.6222712