• DocumentCode
    2381920
  • Title

    A framework for evaluating network optimization techniques

  • Author

    Younis, Ossama ; Ghetie, Andrei ; Eswaran, Sharanya ; Goldberg, Noam ; Samtani, Sunil ; Varshney, Maneesh ; Patel, Mitesh

  • Author_Institution
    Appl. Commun. Sci., Inc. (ACS), Piscataway, NJ, USA
  • fYear
    2012
  • fDate
    21-22 May 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    There is little understanding about how network applications can benefit from mathematical/heuristic optimization techniques, such as cross-layer design. We propose CLASS, a component-based framework for evaluating and comparing network optimization techniques, such as cross-layer design. CLASS uniquely integrates network optimization with high-fidelity simulation to provide an “optimize-and-verify” loop to network designers. Within CLASS framework, we propose two optimization algorithms. One algorithm (ROCA) jointly optimizes routing and channel assignment for cognitive-radio networks. The other algorithm (Flow-Aware Routing or FAR) jointly optimizes routes and MAC schedules in single-channel networks. Both algorithms exploit spatial diversity by reusing channels or slots. We discuss the benefits and applicability of both algorithms in the context of surveillance applications.
  • Keywords
    channel allocation; cognitive radio; heuristic programming; optimisation; radio networks; scheduling; telecommunication network routing; CLASS component-based framework; FAR; MAC scheduling; ROCA; channel assignment; cognitive-radio networks; cross-layer design; flow-aware routing; high-fidelity simulation; mathematical-heuristic optimization techniques; network optimization techniques; optimize-and-verify loop; single-channel networks; spatial diversity; Algorithm design and analysis; Delay; Interference; Optimization; Routing; Throughput; MANET design; TDMA scheduling; channel assignment; cross-layer design; evaluation framework; routing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sarnoff Symposium (SARNOFF), 2012 35th IEEE
  • Conference_Location
    Newark, NJ
  • Print_ISBN
    978-1-4673-1465-7
  • Type

    conf

  • DOI
    10.1109/SARNOF.2012.6222712
  • Filename
    6222712