DocumentCode :
238199
Title :
On noise properties of transistors and amplifiers a critical review
Author :
Pospieszalski, M.W.
Author_Institution :
Nat. Radio Astron. Obs., Charlottesville, VA, USA
fYear :
2014
fDate :
16-18 June 2014
Firstpage :
1
Lastpage :
5
Abstract :
It has been previously shown that the allowed values of minimum noise temperature Tmin and N=Roptgn (Lange noise parameter) for any transistor have to satisfy inequality 1≤4NT0/Tmin≤2. Furthermore, it has been shown that in the useful frequency range for all transistors 4NT0/Tmin≈2. Experimental confirmations have been published for III-V FETs, HEMTs, HBTs (in several different technologies including GaN HEMTs), and CMOS devices. This paper examines the consequences of this fact for widely held and widely published assumptions in the treatment of noise in transistors and amplifiers, amongst those CMOS “gate induced noise” concept and CMOS “noise cancelling” amplifiers. It is shown that some long held concepts need to be reexamined. The discussion is illustrated with experimental data.
Keywords :
CMOS integrated circuits; heterojunction bipolar transistors; high electron mobility transistors; low noise amplifiers; noise measurement; semiconductor device testing; CMOS devices; CMOS noise cancelling amplifiers; HBT; HEMT; III-V FET; Lange noise parameter; gate induced noise; minimum noise temperature; noise treatment; transistor; useful frequency range; CMOS integrated circuits; HEMTs; Integrated circuit modeling; MODFETs; Microwave FET integrated circuits; Microwave amplifiers; Microwave circuits; Bipolar transistors; CMOS; FET; HBT; HEMT; low noise amplifiers; noise; noise measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwaves, Radar, and Wireless Communication (MIKON), 2014 20th International Conference on
Conference_Location :
Gdansk
Print_ISBN :
978-617-607-553-0
Type :
conf
DOI :
10.1109/MIKON.2014.6899979
Filename :
6899979
Link To Document :
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