Title :
New cell of precision microwave dielectric substrates testing
Author :
Yushchenko, A.G. ; Chizhov, V.V.
Author_Institution :
Microwave Devices Lab., Kharkov State Univ., Ukraine
Abstract :
High-Q dielectrical materials are widely used in modern microwave technology. The control of the quality of their production is the most important element of both modern and future technologies. Among different means of control of the dielectrics material parameters, the cells based on the junction ´round waveguides/radial waveguides´ proved to be the most promising ones. The control is carried out by comparing the computed or standard frequency values with the measured frequencies of the waveguide-dielectric resonance of that substrate region, which is in the junction region. Restrictions are imposed on the thickness of the substrate and the value of its permittivity. An improved structure which eliminates these restrictions is described.
Keywords :
circular waveguides; dielectric materials; dielectric measurement; microwave measurement; substrates; computed values; hgh-Q dielectrical materials; measured frequencies; microwave testing; permittivity; precision dielectric substrates testing; quality; radial waveguides; round waveguides; standard frequency values; substrates testing; thickness; waveguide-dielectric resonance; Dielectric materials; Dielectric measurements; Dielectric substrates; Frequency; Measurement standards; Microwave technology; Permittivity measurement; Production; Testing; Waveguide junctions;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.546622
