New cell of precision microwave dielectric substrates testing

Author

Yushchenko, A.G. ; Chizhov, V.V.

Author_Institution

Microwave Devices Lab., Kharkov State Univ., Ukraine

fYear

1996

fDate

17-21 June 1996

Firstpage

74

Lastpage

75

Abstract

High-Q dielectrical materials are widely used in modern microwave technology. The control of the quality of their production is the most important element of both modern and future technologies. Among different means of control of the dielectrics material parameters, the cells based on the junction ´round waveguides/radial waveguides´ proved to be the most promising ones. The control is carried out by comparing the computed or standard frequency values with the measured frequencies of the waveguide-dielectric resonance of that substrate region, which is in the junction region. Restrictions are imposed on the thickness of the substrate and the value of its permittivity. An improved structure which eliminates these restrictions is described.

Keywords

circular waveguides; dielectric materials; dielectric measurement; microwave measurement; substrates; computed values; hgh-Q dielectrical materials; measured frequencies; microwave testing; permittivity; precision dielectric substrates testing; quality; radial waveguides; round waveguides; standard frequency values; substrates testing; thickness; waveguide-dielectric resonance; Dielectric materials; Dielectric measurements; Dielectric substrates; Frequency; Measurement standards; Microwave technology; Permittivity measurement; Production; Testing; Waveguide junctions;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 1996 Conference on

Conference_Location

Braunschweig, Germany

Print_ISBN

0-7803-3376-4

Type

conf

DOI

10.1109/CPEM.1996.546622

Filename

546622