DocumentCode
2382204
Title
Aging and doping effects of nano-structured Mgx Zn1−x O thin films for CNT applications
Author
Ahmad, R. ; Salina, M. ; Teh, A. Awang ; Kara, M. ; Rusop, M. ; Awang, Z.
Author_Institution
Microwave Technol. Centre, Univ. Teknol. MARA, Shah Alam, Malaysia
fYear
2010
fDate
13-14 Dec. 2010
Firstpage
405
Lastpage
409
Abstract
This paper reports on the preparation of nano-structured of MgxZn1-xO thin films by sol-gel spin coating method which will be used as a template layer to grow carbon nanotubes. The MgxZn1-xO films were deposited on Pt/Si (100) substrates. In this work, we focused on the effect of sol aging and Mg content on the film structure and resistivity. Sols with Mg content of x = 0.1, 0.3 and 0.5 were subjected to aging times of between 3 to 240 hours. X-Ray Diffractometer (XRD), energy dispersive analysis by X-ray (EDAX), scanning (SEM) and field emission scanning electron (FESEM) microscopes were used to characterize the structural properties. Results from SEM and FESEM show the thickness and grain size increased with aging up to 240 hours. XRD spectrum reveals the deposited thin films were polycrystalline wurtzite structure. The element of Mg in the ZnO films was confirmed by EDAX. The electrical resistivity also increased with aging time as confirmed by four point probe method. The results suggest that appropriate aging of the sol is important for improving structure quality and electrical performance of MgxZn1-xO thin films.
Keywords
II-VI semiconductors; X-ray chemical analysis; X-ray diffraction; ageing; electrical resistivity; field emission electron microscopy; grain size; magnesium compounds; nanofabrication; nanostructured materials; scanning electron microscopy; semiconductor doping; semiconductor growth; semiconductor thin films; sol-gel processing; spin coating; wide band gap semiconductors; zinc compounds; EDAX; FESEM; MgxZn1-xO; Pt-Si; Pt-Si (100) substrate; Si; X-ray diffractometer; X-ray energy dispersive analysis; XRD spectrum; aging effects; doping effects; electrical resistivity; field emission scanning electron microscopy; four point probe method; grain size; nanostructured thin films; polycrystalline wurtzite structure; sol-gel spin coating; time 3 hour to 240 hour; MgZnO; carbon nanotubes; sol aging time; sol-gel; thin films;
fLanguage
English
Publisher
ieee
Conference_Titel
Research and Development (SCOReD), 2010 IEEE Student Conference on
Conference_Location
Putrajaya
Print_ISBN
978-1-4244-8647-2
Type
conf
DOI
10.1109/SCORED.2010.5704032
Filename
5704032
Link To Document