• DocumentCode
    2382217
  • Title

    Automated integrative analysis of state-based requirements

  • Author

    Czerny, Barbara J. ; Heimdahl, Mats P E

  • Author_Institution
    Delphi Delco Electron. Syst., Kokomo, IN, USA
  • fYear
    1998
  • fDate
    13-16 Oct 1998
  • Firstpage
    125
  • Lastpage
    134
  • Abstract
    Statically analyzing requirements specifications to assure that they possess desirable properties is an important activity in any rigorous software development project. The analysis is performed on an abstraction of the original requirements specification. Abstractions in the model may lead to spurious errors in the analysis output. Spurious errors are conditions that are reported as errors, but information abstracted out of the model precludes the reported conditions from being satisfied. A high ratio of spurious errors to true errors in the analysis output makes it difficult, error-prone, and time consuming to find and correct the true errors. We describe an iterative and integrative approach for analyzing state-based requirements that capitalizes on the strengths of a symbolic analysis component and a reasoning component while circumventing their weaknesses. The resulting analysis method is fast enough and automated enough to be used on a day-to-day basis by practicing engineers, and generates analysis reports with a small ratio of spurious errors to true errors
  • Keywords
    computer aided software engineering; formal specification; formal verification; systems analysis; automated integrative analysis; reasoning; requirements specifications; software development project; spurious errors; state-based requirements analysis; static analysis; symbolic analysis; Birth disorders; Boolean functions; Computer science; Data structures; Electrical capacitance tomography; Error analysis; Error correction; Information analysis; Programming; Read only memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automated Software Engineering, 1998. Proceedings. 13th IEEE International Conference on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-8186-8750-9
  • Type

    conf

  • DOI
    10.1109/ASE.1998.732601
  • Filename
    732601