Title :
Accuracy enhancement of material characterization in sub-THz range
Author :
Piasecki, Przemyslaw ; Godziszewski, K. ; Yashchyshyn, Y.
Author_Institution :
Inst. of Radioelectron., Warsaw Univ. of Technol., Warsaw, Poland
Abstract :
In this paper many aspects of material characterization in sub-THz frequency range are shown. Methods of reducing unwanted reflections from construction of the measurement setup and from the sample under test are proposed. The influence of lens tilt on electromagnetic field distribution in location of the sample is investigated.
Keywords :
lenses; submillimetre wave measurement; terahertz materials; electromagnetic field distribution; lens tilt influence; sample under test; subTHz material range; unwanted reflections reduction; Antenna measurements; Electric fields; Frequency measurement; Lenses; Materials; Permittivity measurement; Reflection; Sub-THz; measurement accuracy; permittivity;
Conference_Titel :
Microwaves, Radar, and Wireless Communication (MIKON), 2014 20th International Conference on
Conference_Location :
Gdansk
Print_ISBN :
978-617-607-553-0
DOI :
10.1109/MIKON.2014.6900001
